Discontinued

Multiple Scanning Knife-Edge Beam Profiler / OS-BA7-IR5-SAT

A compact stand-alone type beam measuring device with an integrated touch screen.

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Part Number
OS-BA7-IR5-SAT
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◦Supports a wide wavelength measurement range (190nm to 2700nm), and capable of measuring beam profile, beam size, beam shape, position and beam intensity. It measures beam size between 3μm and 9mm with 0.1μm resolution.

[Features]
◦12-bit A/D converter enables high resolution sampling.
◦Real-time beam profiling displays beam size, beam intensity and Gaussian fits.
◦Capable of calculating the beam gravity center and ellipticity of loaded data. In addition, it can save external control and logging data in Excel or text (.txt) format using RS232C and TCP/IP communication.
◦USB control type is available as option.
More Information
Catalog Code W5033
RoHS No
CE No
Download Product's Datasheet
Specifications 7-blades, InGaAs detector 5mm circular
LCD LCD 7″ wide
Resolution 800×400
Contrast ratio 350:1
Processor Intel Atom D525 1/8Ghz,one 16GB CF (32 optional) Windows®7 pro
4×RS-232
2LAN PORT.
Sensor type Silicon (Si) 350 - 1100nm
UV-Silicon(UV-Si) 190 - 1100nm
InGaAs (IR) 800 - 1800nm
IR Enhanced (IR) 1200 - 2700nm
Beam size range 3μm - 5mm BA3-Si, BA3-UV
15μm - 10mm BA7-Si, BA7-UV (Oval)
15μm - 9mm BA7-Si, BA7-UV (Round)
3μm - 3mm BA3-IR3, BA3-IR3E
15μm - 3mm BA7-IR3, BA7-IR3E
3μm - 5mm BA3-IR5
15μm - 5mm BA7-IR5
Power range 10μW to 1W with filters for Si and UV-Si heads 10µW to 5mW (no Filters provided) for the InGaAs heads
Power accuracy ±5% for Si and UV-Si heads, ±10% for InGaAs heads
Power resolution 0.1μW
Beamwidth accuracy ±2%
Beamwidth resolution 1µm for beams >100µm in size, 0.1µm for beams <100µm in size
Spectral range 3 for BA3 heads
7 for BA7 heads
Position accuracy ±15μm
Position resolution 1μm
Measurement rate 5Hz
Power resolution 0.1W/cm2 (no Filters provided)
Operating Temperature 10℃~50℃
Weight Sensor head 755 gr with cable, Stand alone unite 1.95Kg with built-in touch screen